Armando R. Garcia graduated from Union College New Jersey in 1980 with an Associate in Applied Science degree in Chemical Technology. Upon graduation, he worked for Exxon Research and Engineering Co. of New Jersey as an NMR Spectroscopist. At Exxon, Armando investigated the properties of liquids and solids using NMR techniques such as Wide Line and pulse methods, including diffusion coefficients using PFG and high resolution for liquids. He received a B.S. in Computer Science from Moravian College, Bethlehem PA in 1999 and worked for Air Products and Chemicals from 1998 to 2003. Armando joined Surface Measurement Systems in July of 2003 as an Applications Chemist and has worked to develop novel DVS and iGC methods.